Groupe de Physique des Matériaux - UMR CNRS 6634

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13 Mars 2014 - Lorenzo Rigutti

Correlating atom probe and optical spectroscopy on single nano-objects

par LABGPM - publié le

Correlating atom probe and optical spectroscopy on single nano-objects, Jeudi 13 mars à 10h30 en salle de Conférence du GPM


Groupe de Physique des Matériaux, UMR CNRS 6634, Université de Rouen

With the development of laser-assisted tomographic atom probes, it has become possible not only to obtain 3D reconstructions of the distribution of chemical species in semiconductor nanostructures and heterostructures, but also to correlate atom probe tomography (APT) to other characterization techniques applied on the same nano-object.
In my seminar I will introduce the correlated approach of atom probe and optical spectroscopy, its motivations, its implementation and its major technical bottlenecks [1]. In particular, I will expose the case of a triple correlated analysis by micro-photoluminescence (µPL), scanning transmission electron microscopy (STEM) and APT performed on a single nanoscale sample containing a set of InGaN/GaN quantum wells (figure below) [2]. I will then shortly discuss how to get beyond the correlated approach in order to implement a coupled approach, i.e. the capability of performing optical spectroscopy studies in situ within a tomographic atom probe.
Finally, I will show some recent results issued by atom probe test studies on III-V and II-VI semiconductors, focusing on the accuracy of their composition measurement. These results point out that for this class of materials the deviation from stoichiometric composition depends mainly on the surface field.

[1] L. Rigutti, A. Vella, F. Vurpillot, A. Gaillard, N. Sevelin-Radiguet, J. Houard, A. Hideur, G. Martel, A. De Luna Bugallo, G. Jacopin et B. Deconihout, « Coupling Atom Probe Tomography and Micro-Photoluminescence Spectroscopy : exploratory results and perspectives, » Ultramicroscopy, 2013.
[2] L. Rigutti, I. Blum, D. Shinde, D. Hernàndez-Maldonado, W. Lefebvre, J. Houard, F. Vurpillot, A. Vella, M. Tchernycheva, C. Durand, J. Eymery et B. Deconihout, « Correlation of Microphotoluminescence Spectroscopy, Scanning Transmission Electron Microscopy, and Atom Probe Tomography on a Single Nano-object Containing an InGaN/GaN Multiquantum Well System, » Nano Letters, vol. 14, n° %11, pp. 107-114, 2014.